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Concept information

优选词,正式主题词

9030 82 00For measuring or checking semiconductor wafers or devices (including integrated circuits)  

范围注释,叙词含义说明

  • Instruments and apparatus for measuring or checking semiconductor wafers or devices, incl. integrated circuits

其它语言

URI

http://data.europa.eu/xsp/cn2024/903082000080

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