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Conceptinformatie

Voorkeursterm

9030 82 00For measuring or checking semiconductor wafers or devices (including integrated circuits)  

Ingangstermen

  • For measuring or checking semiconductor wafers or devices (including integrated circuits)

Bereiksnotitie

  • Instruments and apparatus for measuring or checking semiconductor wafers or devices, incl. integrated circuits

Identifier

  • 903082000080

In andere talen

URI

http://data.europa.eu/xsp/cn2024/903082000080

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